The Detection of Cracks and Busbars Failures in Solar Cells by Moiré Pattern and Laser Speckle Techniques

Authors

  • Balamurugan Rajamanickam Kumaraguru College of Technology, Coimbatore 641 006, India
  • R Thiruneelakkandan Nandha Engineering College, Perundurai 638 052, India

DOI:

https://doi.org/10.56042/ijpap.v63i9.17940

Keywords:

Solar cell, Defects, Busbars faults, Moire pattern, Deformation, Shearography

Abstract

This study investigate the detection of mechanical faults in solar cell busbars, caused by shock wave-induced vibrations, using Moiré pattern analysis followed by laser speckle shearography. The busbars, critical for transferring electrical output, are susceptible to structural damage from vibrations, which can degrade their performance. Moiré pattern analysis is used to identify early deformations and strain, while speckle shearography is employed to provide high-resolution detection of strain changes over time. Regular grids are overlaid on the panel surface to capture Moiré fringes in the early stages of vibration, transitioning to speckle variations for more detailed strain mapping. Failure-prone areas are effectively located by this method, enabling early detection of busbar failure. Advanced optical techniques are integrated to improve fault assessment, extend solar panel lifespan, and enhance durability in photovoltaic applications.

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Published

2025-09-15

How to Cite

The Detection of Cracks and Busbars Failures in Solar Cells by Moiré Pattern and Laser Speckle Techniques. (2025). Indian Journal of Pure & Applied Physics (IJPAP), 63(9). https://doi.org/10.56042/ijpap.v63i9.17940

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