An Investigation of the Structural, Morphological, and Dielectric, Properties of BiNi0.5Se0.5O3

Abstract

The preparation and comprehensive analysis of the BiNi0.5Se0.5O3 material, synthesized via a conventional solid-state route. Phase purity and crystallographic parameters were ascertained by powder X-ray diffraction, confirming the formation of the intended perovskite‐type structure. Microstructural examination by scanning electron microscopy revealed a uniformly polycrystalline morphology, with grain sizes predominantly in the 3 µm range. Elemental composition and stoichiometry were verified through energy-dispersive X-ray spectroscopy, which demonstrated the presence of Bi, Ni, Se, and O in ratios consistent with the nominal formula. Dielectric permittivity and electrical conductivity measurements were performed over a broad spectrum of temperatures and frequencies. Analysis of impedance spectra indicates a pronounced negative temperature coefficient of resistance, attributable to contributions from both grain interiors and grain-boundary regions. The frequency-dependent conductivity follows Jonscher’s universal power law, underscoring a hopping-dominated charge-transport mechanism. Collectively, these findings highlight BiNi0.5Se0.5O3 as a promising candidate for next generation electronic and energy‐storage applications.