Heavy-ion Radiation Strikes on LDD Implanted RingFET using 3D Numerical Device Simulations: IMPACT OF RADIATION ON LDD IMPLANTED RINGFET. Journal of Scientific & Industrial Research (JSIR), [S. l.], v. 84, n. 1, p. 107–114, 2025. DOI: 10.56042/jsir.v84i1.7272. Disponível em: https://or.niscpr.res.in/index.php/JSIR/article/view/7272. Acesso em: 13 may. 2026.